Design of a frequency filter on the basis of the total internal reflection phenomenon
A.S. Syrneva, V.S. Ayrapetyan
Siberian State University of Geosystems and Technologies, Novosibirsk, Russia
Keywords: частотный фильтр, явление полного внутреннего отражения, ширина полосы пропускания, интерференционная картина, спектр излучения, frequency filter, total internal reflection phenomenon, bandwidth, interference pattern, radiation spectrum
Abstract
The results of experimental study of characteristics of a frequency filter designed on the basis of total internal reflection phenomenon are presented. The spectral width of semiconductor laser radiation in the visible region measured with this frequency filter two-fold narrows (from 18 to 10 cm-1 after passing through the frequency filter).
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