DEVELOPMENT OF A PROCEDURE OF X-RAY STUDY OF THIN LAYERS BY THE EXAMPLE OF COBALT PHTHALOCYANINE
A. S. Sukhikh1,2, T. V. Basova1,2, S. A. Gromilov1,2
1Nikolaev Institute of Inorganic Chemistry, Siberian Branch , Russian Academy of Sciences, Novosibirsk, Russia
2Novosibirsk National Research State University, Novosibirsk, Russia
Keywords: фталоцианин кобальта, рентгенографическое исследование тонких пленок, cobalt phthalocyanine, X-ray diffraction study of thin films
Abstract
A procedure of the X-ray diffraction study of thin layers using a single crystal X-ray diffractometer equipped with a microfocus tube is described. It is demonstrated that a-cobalt phthalocyanine layers deposited by thermal vacuum evaporation onto polished surfaces of substrates (glass, quartz) have a perfectly oriented polycrystalline structure. The (00 l ) planes of all crystallites are oriented along the surface of the substrate. The structural organization of layers is analyzed.
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