DYNAMICS OF GROWTH OF THE NATURAL OXIDE OF CdxHg1 - xTe
G. Yu. Sidorov1, V. A. Shvets1,2, Yu. G. Sidorov1, V. S. Varavin1
1Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, 630090, Novosibirsk, prosp. Akadmika Lavrent'eva, 13
2Novosibirsk State University, 630090, Novosibirsk, ul. Pirogova, 2
Keywords: естественный окисел, КРТ, эллипсометрия, natural oxide, MCT, ellipsometry
Abstract
The growth of the natural oxide of the Cdx Hg1 - xTe (MCT) compound is studied by methods of laser and spectral ellipsometry. It is found that a non-absorbing oxide film is formed from the very beginning in the case of MCT oxidation with hydrogen peroxide vapors, whereas oxidation with atmospheric oxygen leads to the formation of absorbing layer on the surface at the first stages of the process. When the oxide film thickness reaches 1-2 nm, the oxidation rate drastically decreases. If MCT samples that were stored for a long time (for years) in air at room temperature are heated at T = 200 ºC, the optical thickness of the oxide film decreases.
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