INVESTIGATION OF INFRARED RADIATION REFLECTION BY DIAPHRAGMS IN THERMAL IMAGING DEVICES
A. R. Novoselov, P. A. Aldokhin, P. P. Dobrovolskii, A. V. Gusachenko, B. N. Novgorodov, K.P. Shatunov, S. M. Churilov
Novosibirsk Branch of the Institute of Semiconductor Physics of the Siberian Branch of the Russian Academy of Sciences, “Technological Design Institute of Applied Microelectronics", Russia, Novosibirsk
Keywords: photodetector devices, cryostat, infrared radiation
Abstract
The reflection of infrared radiation from diaphragm coatings in photodetector devices: black polymer paint, anodic oxide, etched kovar, suspension of graphite or titanium oxide in cryogen-resistant varnish, and others are investigated. The spectra and integral reflection coefficients of the diaphragm coatings in the wavelength range of 2÷14 microns at the radiation incidence angles of 15 and 45 ◦ are elucidated. The levels of reflected infrared radiation in the spectral ranges of 3.4-4.8 and 7.5-13.5 microns are also studied in a wide range of angles from 0 to 80° for a radiation incidence angle of about 15°. According to the research results the lowest level of infrared radiation reflection is provided by the coating of a graphite suspension in a cryogen-resistant varnish (developed at the Novosibirsk Branch of the Institute of Semiconductor Physics of the Siberian Branch of the Russian Academy of Sciences “Technological Design Institute of Applied Microelectronics”, Novosibirsk). The integral reflection coefficients for this coating are 3.98% (in the spectral range of 3-5 microns) and 5.69% (in the range of 8-12 microns).
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