TRANSFORMATION OF THE OPTICAL CHARACTERISTICS OF A REFLECTING INTERFEROMETER IN POLARIZED LIGHT
N.D. Goldina
Institute of Laser Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia
Keywords: multipath interferometer, reflected polarized light, metal layer
Abstract
A new version of the reflective interferometer for S-polarized light consists of a thin metal film placed in front of a multilayer dielectric interferometer. The appearance of narrow extrema (maxima or minima) in the spectral or angular dependence of the reflection coefficient depends on the location of the metal film in the node or the antinode of the standing wave reflected from the interferometer.
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