X-RAY AND AUGER MICROPROBE STUDIES OF VANADIUM-DOPED LAYERED CHROMIUM-COPPER DISULFIDE CRYSTALS
V. V. Sokolov1, E. V. Korotaev1, N. N. Peregudova1, B. M. Kuchumov1, P. A. Prozorov1, M. V. Topyakova2, L. N. Mazalov1,2,3, Yu. P. Dikov4, M. I. Buleev4, A. Yu. Pichugin1, I. Yu. Filatova1, A. S. Berdinskii2, A. A. Velichko2
1Nikolaev Institute of Inorganic Chemistry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia
2Novosibirsk State Technical University, Novosibirsk, Russia
3Novosibirsk State University, Novosibirsk, Russia
4Institute of Geology of Ore Deposits, Petrography, Mineralogy, and Geochemistry, Russian Academy of Sciences, Moscow, Russia
Keywords: layered chromium-copper disulfides, crystals, Auger microprobe studies, SEM, EDX analysis, powder X-ray analysis, inclusions
Abstract
In the work, X-ray and Auger microprobe studies of the surface of crystals prepared from powder samples of CuCr1-xVxS2 disulfides (x = 0÷0.11) by crystallization from melt in the sulfur vapor atmosphere. Sample slabs cut from ingots include crystalline layered blocks with different orientation of copper-containing extended linear inclusions separated by disulfide matrix layers. The results of the microprobe analysis of regions with copper-containing inclusions and the regions adjacent to them are presented.
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