Investigations on the Ignition Characteristics of a Semiconductor Bridge with an Electrostatic Discharge
X.-R. Guo, L. Zhang, Sh.-G. Zhu, Y. Li, P. Ma
Keywords: electrostatic discharge, semiconductor bridge, ignition characteristics, invalidation threshold voltage, multiple discharging
Abstract
The damage characteristics of a typical semiconductor bridge and a micro-semiconductor bridge under the action of an electrostatic discharge are studied in experiments, which include semiconductor film shape measurement, resistance fluctuate evaluation, ignition characteristics, and invalidation threshold voltage measurement. The effect of multiple discharging on the bridge state is also discussed.
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