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Journal of Structural Chemistry

2010 year, number 7

Atomic-emission analysis of high-purity oxides with concentration of impurities by distilling off the matrix during fluorination in autoclave

I. I. Evdokimov, M. M. Lipatova, V. G. Pimenov
Keywords: atomic-emission analysis, concentration of impurities, germanium(IV) oxide, molybdenum(VI) oxide, tellurium(IV) oxide, tungsten(VI) oxide
Pages: 193-197

Abstract

A unified technique was developed for chemical atomic-emission analysis of high-purity germanium(IV), molybdenum(VI), tellurium(IV) and tungsten(VI) oxides based on preliminary concentration of non-volatile impurities by distilling off the matrices after chemical transformations into volatile fluorides by xenon difluoride vapor in an autoclave. The impurity concentrate was analyzed by atomic-emission method with arc and induction discharges. The detection limits of impurities in a gram analytical sample were found to be 10-6-10-8 wt.%.