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Journal of Structural Chemistry

2009 year, number 4

DEPENDENCE OF THE REACTIVITY OF ALKYL-DOPED SILICON DIOXIDE LAYERS ON THE CHARACTER OF Si-O-Si BONDING

F. N. Dultsev
Keywords: surface reconstruction, porous silicon dioxide, molecular mechanics
Pages: 623-628

Abstract

Using MM2 molcular mechanics simulation and MNDO/PM3 semiempirical methods we show that the most probable mechanism of surface modification of alkyl-doped silicon dioxide layers in plasma is the interaction with СН3 groups. Detachment of the hydrogen atom causes a change in the character of Si-O-Si bonding, which results in an increase in the number of Si-O-Si groups with an angle in a range of 144° to 146°. Subsequent treatment in ammonia plasma leads to pore sealing through the formation of -CH-Si-O-Si-O-Si-O-Si- chains. The mechanism proposed provides a good explanation to FTIR experimental spectra and to changes in the reactivity of porous layers after treatment in helium plasma.