DETERMINATION OF THE PARAMETERS OF ATOMIC PAIR CORRELATIONS IN NICKEL OXIDE FILMS BY THE ELECTRON ENERGY LOSS FINE STRUCTURE METHOD
D. E. Guy, O. R. Bakieva, A. N. Deev, F. Z. Gilmutdinov
Keywords: electronic spectroscopy, electron energy loss spectra, atomic pair correlation function
Pages: 275-282
Abstract
The electron energy loss extended fine structure (EELFS) spectra were obtained from the pure nickel surface (M2,3 EELFS) of a stoichiometric NiO film (NiM2,3 and OK EELFS spectra) and the "nonhomogeneous" oxide film on the surface of nickel Ni-O (NiM2,3 and OK EELFS spectra). The amplitudes and intensities of electron transitions for the core levels of atoms were calculated with regard for the multiplicity of electron impact excitation of the corresponding core levels of atoms. The corresponding normalized oscillating terms were isolated using the results of calculations based on the experimental EELFS spectra. Agreement between the experimental and calculated (on Ni and NiO test objects) data showed that the theoretical approaches used and the calculated data for describing the EELFS spectra are good approximations. Using the results of calculations and the parameters of secondary electron elastic scattering (FEEF-8 data) we obtained the atomic pair correlation functions from the experimental normalized oscillating parts of the EELFS spectra by Tikhonov's regularization method.
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