FIZEAU INTERFEROMETER WITHOUT DESTRUCTIVE INTERFERENCE FRINGES AND SPECKLES
V. P. Koronkevich, A. I. Lokhmatov, A. E. Matochkin, and A. R. Gerent
Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences
Novosibirsk, Russia, E-mail: matochkin@iae.nsk.su
Pages: 252-255
Abstract
The possibility of decreasing the depth of interference region in the Fizeau interferometer configuration with a semiconductor laser is considered for problems concerned with inspection of plane-parallel plates.
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