FUNDAMENTAL BASIC OF TECHNOLOGY OF ULTRA-HIGH-DIMENSION MOSAIC FOCAL PLANE ARRAYS (CONCEPTUAL REVIEW)
A. I. Kozlov
Rzhanov Institute of Semiconductor Physics, Siberian Branch of Russian Academy of Sciences, Novosibirsk, Russia
Keywords: mosaic technology, ultra-high-dimension mosaic focal plane arrays (MFPAs), technological "blind zone", maximum image-conversion efficiency, multilayer structures with quantum wells (MSQW), parameters of infrared (IR) MFPA
Abstract
Fundamental research of basic creating mosaic focal plane arrays (MFPAs) allowed to optimize the prototype of mosaic technology with decreasing "blind zones". At the same time, minimal damage areas are provided at the edges of the crystals after separating the wafers with the achievement of minimum gaps between crystals of adjacent submodules up to a value of no more than 2-3 microns for different determining materials. The parameters of infrared MFPAs are investigated depending on the wavelength of the maximum spectral characteristic of the photosensitivity of multilayer structures with quantum wells, on the pitch of quantum well photodetectors and on the format of submodules. In a series of the proposed variants of technological prototypes, the "blind zones" of the MFPA are optically overlapped and the ultimate, 100%, image-conversion efficiency is provided. The mosaic technology is one of the fundamental principles of achieving ultra-high dimension of the MFPAs with maximum image-conversion efficiency.
|
