A STUDY OF ZNSXSE1-X@AL2O3 NANOSTRUCTURES BY X-RAY DIFFRACTION AND EXAFS SPECTROSCOPY
A.I. Chukavin1, R.G. Valeev1, Ya.V. Zubavichus2, A.L. Trigub1,2, A.N. Bel'tyukov1
1Physico-Technical Institute, Ural Branch, Russian Academy of Sciences, Izhevsk, Russia
2National Research Center Kurchatov Institute, Moscow, Russia
Keywords: ZnSSe, наноструктуры, EXAFS, рентгеновская дифракция, нанопористый анодный оксид алюминия, термическое напыление, nanostructures, X-ray diffraction, nanoporous anodic alumina, thermal deposition
Abstract
Nanocomposite systems based on ternary semiconductor compounds ZnS x Se1-x with different compositions (x = 0, 0.3, 0.5, 0.7, 1) in dielectric matrices of nanoporous anodic alumina (AA) are synthesized by ultrahigh vacuum thermal sputtering of a mixture of lead sulfide and selenide powders. The effect of the atomic concentration of solid solutions and structural parameters of the AA template matrix on the crystal structure of synthesized nanocomposites and the local atomic environment of Zn and Se atoms is investigated.
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