INHIBITING FILMS FOR PICOSECOND NEW GENERATION DISSECTORS
N. V. Ageev, S. R. Ivanova, A. S. Komel'kov, G. P. Levina, V. A. Makushina, Y. M. Mikhaltkov, T. A. Skaballanovich
Prokhorov General Physics Institute, Russian Academy of Sciences, 119991, Moscow, ul. Vavilova, 38
Keywords: электронно-оптические преобразователи и диссекторы, тормозящие плёнки, вторичная эмиссия, синхротронное излучение, electro-optical converters and dissectors, inhibiting films, secondary emission, synchrotron radiation
Abstract
This paper describes the selection of inhibiting films made of aluminum of various thicknesses (300-500 nm) and intended for inhibiting electrons (with an energy of tens of kilo-electron-volts to tens of electron volts) in the developed new generation picosecond dissectors. The designed dissectors should be different by a high time resolution as compared to the one maximum reached ( 20 ps) in LI-602 dissecting electron-optical converters used to diagnose synchrotron radiation. The comparative measurements of emission characteristics of manufactured films in the models of electron-optical converters similar in design to a PIF-01/S1 device taken as a basis for the dissectors and providing the maximum time resolution of up to 1 ps in the mode of single linear sweep with the sweep velocity of 1010 cm/s. It is established that, with the incident electron beam energy equal to 10-12 keV, the optimum thickness of the inhibiting aluminum film is 400 nm for the effective secondary emission coefficient of 0.7.
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