FEATURES OF THE ELLIPSOMETRIC INVESTIGATION OF MAGNETIC NANOSTRUCTURES
O. A. Maksimova1,2, N. N. Kosyrev2,3, S. N. Varnakov2,3, S. A. Lyashchenko2,3, S. G. Ovchinnikov1,2
1Siberian Federal University, Krasnoyarsk, Russia
2Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, Krasnoyarsk, Russia
3Reshetnev Siberian State Aerospace University
Keywords: магнитоэллипсометрия, эллипсометрические измерения, магнитооптический эффект Керра, тонкие пленки, модель полубесконечной среды, коэффициент преломления, коэффициент поглощения, магнитооптический параметр, magneto-ellipsometry, ellipsometric measurements, magneto-optical Kerr effect, thin films, semi-infinite medium model, refraction coefficient, absorption coefficient, magneto-optical parameter
Abstract
The technique for interpreting magneto-ellipsometric measurements is proposed. The model of a homogeneous semi-infinite medium for reflecting layered magnetic structures in the presence of the magnetic field in the configuration of the magneto-optical equatorial Kerr effect is considered. Based on the analysis of the Fresnel coefficients with regard to the magneto-optical parameter
Q appearing in the off-diagonal elements of the permittivity tensor, the expressions are obtained using which the refraction (
n) and absorption (
k) coefficients, the real (
Q
1) and imaginary (
Q
2) parts of the magneto-optical parameter can be found from the ellipsometric (ψ
0 and Δ
0) and magneto-ellipsometric (ψ
0 + δψ and Δ
0 + δΔ) measurements. The results will allow to measure and analyze the magnetic characteristics such as hysteresis loops and the coercitive force of layered nanostructures using the conventional ellipsometric equipment.
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