A SMALL-ANGLE X-RAY SCATTERING STUDY OF THE NANOSTRUCTURAL FEATURES OF HIGH-ASH CARBON MATERIALS
Yu. V. Larichev1,2, A. P. Koskin1, P. M. Eletskii1, S. A. Poluyanov1, F. V. Tuzikov1,2, A. V. Ishchenko1, D. A. Zyuzin1
1Boreskov Institute of Catalysis, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia
2Novosibirsk State University, Russia
Keywords: углерод-кремнеземные композиты, просвечивающая электронная микроскопия, рентгеновская дифрактометрия, малоугловое рентгеновское рассеяние, контрастирование, carbon-silica composites, transmission electron microscopy, X-ray diffraction, small-angle X-ray scattering, masking liquid
Subsection: PROCEEDINGS OF THE CONFERENCE “METHODS FOR STUDYING THE COMPOSITION AND STRUCTURE OF FUNCTIONAL MATERIALS,” OCTOBER 21-25, 2013, NOVOSIBIRSK, RUSSIA
Abstract
Nanostructured carbon-silica composite materials are prepared from different compounds in one-pot. They are characterized by BET, transmission electron microscopy, X-ray diffraction, and small-angle X-ray scattering. An effective method of the quantitative analysis of the structural dispersed characteristics of the template phase of silica in these composites is proposed.
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