Analysis of Feв€’Si layered structures by reflected electron energy loss spectroscopy and inelastic scattering cross-section
A. S. Parshin, G. A. Aleksandrova, S. N. Varnakov, S. G. Ovchinnikov
Keywords: reflected electron energy loss spectroscopy, inelastic scattering cross-section, mean length of the inelastic free path of an electron
Pages: 451-455
Abstract
This paper reports on our study of the formation of an interface of layered structures in the Fe-Si system by reflected electron energy loss spectroscopy (REELS). Quantitative element analysis was performed using the product of the mean length of the inelastic free path by the inelastic scattering cross-section of electrons. It is shown that the Fe-Si interface is quite uniform.
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