X-RAY DIFFRACTION AND POSITRON ANNIHILATION LIFE-TIME SPECTROSCOPY STUDIES OF POLYMETALLOORGANOSILOXANES
S. V. Gardionov, N. P. Shapkin, M. I. Balanov, V. V. Vasilieva, V. I. Razov, V. O. Trukhin
Far Eastern Federal University, Vladivostok, Russia
Keywords: полиметаллоорганосилоксаны, рентгеновская дифрактометрия, позитронная аннигиляционная спектроскопия, области когерентного рассеяния, методика Миллера-Бойера, polymetalloorganosiloxanes, X-ray diffractometry, positron annihilation life-time spectroscopy, coherent scattering regions, the Miller-Boyer method
Abstract
X-ray diffractometry and positron annihilation life-time spectroscopy are applied to study the structural features of polymetallophenylsiloxane (PMOS) samples with the Si/M ratio corresponding to the metal valence state, namely, interplanar spacings ( d001), coherentscattering region (CSR) sizes, cross-section areas of polymer chains ( s ) calculated by the Miller-Boyer method, and the degree of amorphousness (β). It is demonstrated that the direct proportional dependence between the logarithm of the interplanar spacing d001 and the logarithm of the cross-section area s is observed for PMOSs. This is an inverse dependence relative to changes in the crystal chemical ion radius. The extraction of the iron ion from polyferrophenylsiloxane leads to a sharp decrease in the interplanar spacing, which turns out to be less than d 001 in polyphenylsiloxanes, and also CSR increases due to a decrease in the diameter of the polymer chain. The positron annihilation life-time spectroscopy data show the observed direct dependence of the annihilation intensity ( I3), the annihilation rate ( K3), the degree of amorphousness on the PMOS cross-section area.
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