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Journal of Structural Chemistry

2010 year, number 7

Solid State Voltammetry for diagnostics of functional materials

N. F. Zakharchuk, T. P. Smirnova, V. E. Fedorov
Keywords: solid state voltammetry, oxide layers, superconductors
Pages: 171-177

Abstract

Solid state voltammetry was used for phase analysis of the natural oxide films on AIIIBV semiconductors. Such films, both anodic and thermal, were shown to be inhomogeneous mixtures of various phases and their structural modifications. Unstable state of the natural oxide layers on AIIIBV semiconductors was caused by their surface oxidation leading to the formation of nonequilibrium set of phases, their amorphous and unstable crystalline forms. A technique for express identification of superconducting phases and their characteristics was developed. All electrochemical characteristics of the detected signal indicate the presence of oxygen in superconducting phases, which is able to accept electrons and thus provide electroneutrality of the molecule.